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oim electron backscatter diffraction system  (Gatan Inc)


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    Gatan Inc oim electron backscatter diffraction system
    Oim Electron Backscatter Diffraction System, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1114 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/electron+backscattered+diffraction+analysis/OIM+Analysis/pmc12471951-46-20-19
    Average 96 stars, based on 1114 article reviews
    oim electron backscatter diffraction system - by Bioz Stars, 2026-09
    96/100 stars

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    other:

    Article Title: Surface properties of dental zirconia ceramics affected by ultrasonic scaling and low-temperature degradation.
    Article Snippet: In addition, to analyze the depth of the monoclinic layer, the cross-sectional surface of specimens was analyzed using an SEM (SU5000; Hitachi, Tokyo, Japan) with a detector for electron backscattered diffraction analysis (EBSD; EDAX Pegasus EDS/EBSP; Ametek, Berwyn, PA, USA).



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    EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Journal: Materials

    Article Title: Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches

    doi: 10.3390/ma19091831

    Figure Lengend Snippet: EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Article Snippet: Electron backscatter diffraction (EBSD) analysis was performed using a JEOL JSM-7800F SEM (Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan) to characterize the grain size, crystallographic orientation, grain boundary (GB) distribution, and recrystallized fraction (RF).

    Techniques:

    EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Journal: Materials

    Article Title: Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches

    doi: 10.3390/ma19091831

    Figure Lengend Snippet: EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Article Snippet: Electron backscatter diffraction (EBSD) analysis was performed using a JEOL JSM-7800F SEM (Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan) to characterize the grain size, crystallographic orientation, grain boundary (GB) distribution, and recrystallized fraction (RF).

    Techniques: